IC socket 32QN65S17070

The 32QN65S17070 test socket, manufactured by Plastronics, is a precision-engineered solution tailored for QFN32 packages.

Designed to accommodate packages with dimensions of 7mm by 7mm, this socket is built to handle the unique requirements of semiconductor testing. It supports 32-pins QFN packages with a pitch of 0.65mm, ensuring accurate alignment and reliable contact during testing.

Featuring a Clam-Shell design, this socket ensures a secure and stable connection during testing and higher variability of package thickness acceptance. Its hinged mechanism allows for effortless manual operation, making it ideal for frequent device insertion and removal. Its robust construction is available in a through hole configuration, solder-mounted on the PCB.

IC socket QFN 32QN65S17070 is equipped with a ground pin, which serves a critical role in enhancing signal integrity and mitigating electrical interference during testing. Ground pins are commonly used to provide a low-impedance path to ground, ensuring stable signal reference points and reducing noise that may impact testing accuracy. By maintaining a reliable ground connection, the socket delivers improved performance, particularly for high-frequency and sensitive applications.

Engineered for longevity, it guarantees at least 5000 actuations (Opening and closing the lid counts as one actuation), and standard operational temperature range.

Socket drawing available upon request.

For additional information regarding this part or if you're unsure whether your package is compatible with this socket, please inquire about part number 32QN65S17070