IC socket 76LQ40S19090

The 76LQ40S19090 test socket, manufactured by Plastronics, is a precision-engineered solution tailored for QFN76 packages.

Designed to accommodate packages with dimensions of 9mm by 9mm and a height of 0.85mm, this socket is built to handle the unique requirements of semiconductor testing. It supports 76-pins QFN packages with a pitch of 0.4mm, ensuring accurate alignment and reliable contact during testing.

Crafted with an Open Top design, this socket offers ease of use and a suitable solution for autoloading equipment or robotic handlers. Its robust construction is available in a through hole configuration, solder-mounted on the PCB.

IC socket QFN 76LQ40S19090 is equipped with a ground pin, which serves a critical role in enhancing signal integrity and mitigating electrical interference during testing. Ground pins are commonly used to provide a low-impedance path to ground, ensuring stable signal reference points and reducing noise that may impact testing accuracy. By maintaining a reliable ground connection, the socket delivers improved performance, particularly for high-frequency and sensitive applications.

Engineered for longevity, it guarantees at least 50000 actuations (Inserting or removing the device counts as one actuation), and standard operational temperature range.

Socket drawing available upon request.

For additional information regarding this part or if you're unsure whether your package is compatible with this socket, please inquire about part number 76LQ40S19090