IC socket IC610-0644-006-G

The IC610-0644-006-G test socket, manufactured by Yamaichi, is a precision-engineered solution tailored for QFN64 packages.
This test socket fits QFN/DFN device 9x9 mm and thickness between 0.5-1.2mm.

Designed to accommodate packages with dimensions of 9mm by 9mm, this socket is built to handle the unique requirements of semiconductor testing. It supports 64-pins QFN packages with a pitch of 0.5mm, ensuring accurate alignment and reliable contact during testing.

Featuring a Clam-Shell design, this socket ensures a secure and stable connection during testing and higher variability of package thickness acceptance. Its hinged mechanism allows for effortless manual operation, making it ideal for frequent device insertion and removal. Its robust construction is available in a through hole configuration, solder-mounted on the PCB.

Engineered for longevity and standard operational temperature range.

Socket drawing available upon request.

For additional information regarding this part or if you're unsure whether your package is compatible with this socket, please inquire about part number IC610-0644-006-G